| 作 者： | 多米尼克 |
| 出版社： | 科学 |
| 丛编项： | 国外电子信息精品著作(影印版) |
| 版权说明： | 本书为公共版权或经版权方授权，请支持正版图书 |
| 标 签： | 电子其他 |
| ISBN | 出版时间 | 包装 | 开本 | 页数 | 字数 |
|---|---|---|---|---|---|
| 未知 | 暂无 | 暂无 | 未知 | 0 | 暂无 |
Preface
Introduction
Jose Machado da Silva
Glossary
Part I ADC Characterisation Based on Sinewave Analysis
1
ADC Applications, Architectures and Terminology
Jose Machado da Silva, Helio Mendonga
1.Introduction
2.ADCs' applications
3.ADCs' architectures
4.Terminology
5.Quantisation and A/D conversion
6.Output coding
7.Errors, non-linearity, noise, and distortion
8.Data acquisition and processing
9.Input characteristics
2
Sinewave Test Setup
Pierre-Yves Roy, Jacques Durand
1.Test Setup description
2.Specification of the clock and input signal
3.Example of filter specification
4.Filter selection
5.Taking a record of data
3
Time-Domain Data Analysis
Dominique Dallet, Djamel Haddadi, Philippe Marchegay
1.Introduction
2.Calculation of the dynamic parameters
3.Definitions
4.The fixed-frequency method
5.The four-parameter method
6.Definitions of THD and SNR
7.The multi-harmonic sine-wave fitting method
8.Estimation of the normalised angular frequency
9.Estimation of the linear parameters
10.On the rank of Ep
11.The algorithm
12.Multitone test to circumvent signal purity problems
4
Frequency-Domain Data Analysis
Pierre- Yves Roy, Jacques Durand
1.Discrete Fourier Transform and Fast Fourier Transform
2.Choice of input and clock frequencies
3.Windowing
4.Comment on the accuracy of the input frequency
5.Record size
6.Calculation of ADC dynamic parameters in the frequency domain
5
Code Histogram Test
Giovanni Chiorboli, Carlo Morandi
1.Introduction
2.The sampling strategy and its contribution to count variance and measurement uncertamty
3.Additional contributions to count uncertainty: additive noise andjitter
4.Factors affecting the p.d.f, of the input signal
5.Required record length and number of records, expression of mea-surement uncertainty
6.Choice of the coverage factor
7.Comparing the number of samples required by random and by syn-chronous sampling.
8.Determining the transfer characteristic
9.Offset error and gain
10.Linearity errors
11.Appendix
6
Comparative Study of ADC Sinewave Test Methods
JoseMachado da Silva, Helio Mendonga, Sara Mazoleni
1.Introduction
2.General considerations
3.Simulation results
4.ATE Implementation
5.Conclusions
Part II Measurement of Additional Parameters
7
Jitter Measurement
Pierre-Yves Roy, Jacques Durand
1.Introduction
2.The double beat technique
3.The joint probability technique
4.Conclusion
8
Differential Gain and Phase Testing
JoseMachado da Silva, Helio Mendonga
1.Introduction
2.Test setup and hardware requirements
3.Analysis
4.Test results
5.Calculation of differential gain and phase from the test results
9
Step and Transient Response Measurement
Giovanni Chiorboli, Carlo Morandi
1.Introduction
2.Settling time and transition duration of step response
3.Frequency response measurement
10
Hysteresis Measurement
Giovanni Chiorboli Carlo Morandi
1.Introduction
2.Test conditions
3.A practical case
4.Collection of samples in HC↑ and HC↓
5.Some warning
References
Index
